TS-DEM Development of Electronic Modules Group

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TS-DEM Development of Electronic Modules Group. Erik van der Bij CERN. Agenda. Services and organisation of TS-DEM Organisation of files in EDMS (AB/PO) Reliability engineering. MANDATE Turn schematics into boards (standard + special). PCB design Manufacture of special circuits and PCBs - PowerPoint PPT Presentation

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  • Selon convention signe par AB-PO et TS-DEM (Document EDMS 801714 v1)1 carte: HCRBSxxxxx = EDA-yyyyy-Vx-xUn dossier de fabrication unique GEREGHCREHAR002Code de fabrication TS-DEM: EDA-xxxxx-Vx-xCode dexploitation AB-PO : HCRBSxxxxxEnregistrement des cartes fabriques par TS/DEM Christophe Mugnier :Prsentation du 16 Juin 2006

  • Dossiers de fabrication TS/DEM Christophe Mugnier :Prsentation du 16 Juin 2006

  • Dossiers de fabrication TS/DEM - Identification d'une carte La srigraphie de la face avant:Elle comporte le code EDA et la dsignation de la carte.Etiquette appose par lassembleur sur le connecteur dans le cas dune excution.La srigraphie du print: Elle comporte le code EDA+la version et la dsignation de la carte.

  • Dossiers de fabrication TS/DEM - Identification d'un chassis La srigraphie de la face avant:Elle comporte le code EDA et la dsignation du chassis.Etiquette appose par lassembleur pour spcifier la version.

  • Dossiers de fabrication TS/DEM - Example en EDMS Example:http://edms.cern.ch/nav/eda-01586

    CERN TS -DEM CERNErik van der Bij

    Reliability engineeringIn development phase: qualitative strategyFind weak points fast - whatever it takes

    Accelerated testing: quantative strategyget idea of final reliabilityconcepts (without acceleration) also valid to get data for our installed base

    Ideas from Hobbs Engineering course "Demonstrating Reliability Requirements with Accelerated Testing" and book "Accelerated Reliability Engineering - HALT and HASS"http://hobbsengr.com, see also http://weibull.com

    CERN TS -DEM CERNErik van der Bij

    Stress-Strength "Non-interference"

    CERN TS -DEM CERNErik van der Bij

    Qualitative strategy

    CERN TS -DEM CERNErik van der Bij

    Effect of qualitative testing

    CERN TS -DEM CERNErik van der Bij

    HALT

    CERN TS -DEM CERNErik van der Bij

    PDF to CDFProbabilityTimeTimeUnreliabilityUnreliabilityTime

    CERN TS -DEM CERNErik van der Bij

    Weibull function handles all shapes

    CERN TS -DEM CERNErik van der Bij

    Paperclip example

    CERN TS -DEM CERNErik van der Bij

    Calibrated Accelerated Lifetime Test

    CERN TS -DEM CERNErik van der Bij

    Example of Voltage CALTCar electronics 12-15 Volt

    CERN TS -DEM CERNErik van der Bij

    Example of Tcycle CALT

    CERN TS -DEM CERNErik van der Bij

    Wiper graph

    CERN TS -DEM CERNErik van der Bij

    A serious test flow

    CERN TS -DEM CERNErik van der Bij

    ConclusionsDevelopmenthave fun with your cards and 'burn' a few. You learn a lot!temperature, voltage, vibration, on/off cycles...Know (measure) the environment of your cardse.g. on-time, on/off cyles and temperature variationsis needed to calibrate acceleration factorsMeasure precisely the on-time, on/off cycles etc of each card to know precisely when failedallows Weibull plotting and gives invaluable reliability data

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